Annealing temperature effect on the Structure, Morphology and Optical properties of Copper Oxide CuO thin Films

Copper oxide (CuO) thin films were deposited on glass substrates by (sol-gel ) method using a spin -Coating technique and the speed of coater was fixed at 3000 rpm for 30 sec samples are annealed temperatures (250,350,450 550) ° C 1 hrs. The structural, Morphology, optical properties film determined X-ray diffraction (XRD), Atomic force microscopy (AFM) UV-visible spectroscopy respectively. XRD patterns showed that copper prepared has polycrystalline structure when increase annealing temperature over than 300° turns from phase Cu2O to CuO through examination average grain size increases with either Optical examinations decrease in transmission absorption coefficient temperature. have direct energy gap value decreased increasing 3.99 eV 3.94